IEC 61967-4 Edition 1.1-2006 集成电路.150kHz～1GHz电磁辐射测量.第4部分_电导辐射测量.1～150Ω直接耦合法.pdf

标准号：IEC 61967-4 Edition 1.1-2006
实施状态：现行
中文名称：集成电路.150kHz～1GHz电磁辐射测量.第4部分:电导辐射测量.1～150Ω直接耦合法
英文名称：Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 ?/150 ? direct coupling method
发布日期：2006-07
起草单位：IEC/SC 47A
标准简介：This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission
(EME) of integrated circuits by direct radio frequency (RF) current measurement with a
1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These
methods guarantee a high degree of repeatability and correlation of EME measurements.
IEC 61967-1 specifies general conditions and definitions of the test methods.
文件格式：PDF
文件大小：2.34MB
文件页数：74
（以上信息更新时间为：2019-11-25）



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