ISO_TS 13762-2001 粒度分析 小角度X射线溅射法.pdf

标准号：ISO/TS 13762-2001
实施状态：作废
中文名称：粒度分析  小角度X射线溅射法
英文名称：Particle size analysis - Small angle X-ray scattering method
发布日期：2001-03
采用标准：BS DD ISO/TS 13762-2002,IDT;GB/T 13221-2004,MOD
起草单位：ISO/TC 24
标准简介：This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped.
The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to:
a)  powders containing particles whose morphology is far from spherical, except by special agreement;
b)  powders consisting of porous particles;
c)  mixtures of powders.
文件格式：PDF
文件大小：382.59KB
文件页数：30
（以上信息更新时间为：2019-11-23）



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