ISO_IEC 10373-3-2001 识别卡 测试方法 第3部分：带触点的集成电路卡及相关器件.pdf

标准号：ISO/IEC 10373-3-2001
实施状态：作废
中文名称：识别卡  测试方法  第3部分：带触点的集成电路卡及相关器件
英文名称：Identification cards - Test methods - Part 3: Integrated circuit(s) cards with contacts and related interface devices
发布日期：2001-02
被替代标准：ISO/IEC 10373-3-2010
代替标准：ISO/IEC FDIS 10373-3-2000
采用标准：ANSI/INCITS/ISO/IEC 10373-3-2001,IDT;BS ISO/IEC 10373-3-2001,IDT;GB/T 17554.3-2006,MOD;JIS X 6305-3-2002,IDT;JIS X 6305-3-2002,IDT;CAN/CSA-ISO/IEC 10373-3-02-2002,IDTN-ISO/IEC 10373-3-2004,IDT
起草单位：ISO/IEC JTC 1/SC 17
标准简介：This part of ISO/IEC 10373 defines test methods for characteristics of integrated circuit(s) cards with contacts and related interface devices according to the definition given in ISO/IEC 7816. Each test method is cross-referenced to one or more base standards, which may be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications.
NOTE 1    Criteria for acceptability do not form part of this International Standard but will be found in the International Standards mentionad above.
This part of ISO/IEC 10373 deals with test methods, which are specific to integrated circuit technology with contacts ISO/IEC 10373-1 deals with test methods which are common to one or more card technologies and other parts deal with other technology-specific tests.
Test methods described in this part of ISO/IEC 10373 are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods described in this part of ISO/IEC 10373 are based on specifications defined or to be defined in ISO/IEC 7816.
Conformance of ICCs and IFDs determined using the test methods defined in this part of ISO/IEC 10373 do not preclude failures in the field. Reliability testing is outside the scope of this part of ISO/IEC 10373.
文件格式：PDF
文件大小：396.14KB
文件页数：88
（以上信息更新时间为：2019-11-23）



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