标准号：IEC 61163-1-2006
实施状态：现行
中文名称：可靠性应力筛选.第1部分:批生产可修复产品
英文名称：Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
发布日期：2006-06
代替标准：IEC 56/1102/FDIS-2006;IEC 61163-1-1995;IEC 61163-1 Corrigendum 1-1999
采用标准：DIN EN 61163-1-2007,IDT;BS EN 61163-1-2007,IDT;EN 61163-1-2006,IDT;NF C20-301-1-2007,IDT;OEVE/OENORM EN 61163-1-2007,IDT;PN-EN 61163-1-2008,IDT;UNE-EN 61163-1-2010,IDT
起草单位：IEC/TC 56
标准简介：This part of IEC 61163 describes particular methods to apply and optimize reliability stress
screening processes for lots of repairable hardware assemblies, in cases where the
assemblies have an unacceptably low reliability in the early failure period, and when other
methods, such as reliability growth programmes and quality control techniques, are not
applicable. The reasons for using reliability stress screening may be time constraints and/or
the very nature of the deficiencies that the reliability stress screening is designed to catch.
The processes apply to any stage of a series production of repairable assemblies (see
Figure 3). The methods for setting up a process can be used during production planning,
during pilot-production, as well as during well-established running production.
A prerequisite for the application of the methods is that a certain level of flaws remaining in
the outgoing assembly can be specified.
The processes described are general processes for reliability stress screening in cases where
no specific process is described in a product standard. They are also intended for use by IEC
committees in connection with preparation of product standards. A reliability stress screening
process can form part of an overall reliability programme (see IEC 60300-2).
文件格式：PDF
文件大小：1.49MB
文件页数：170
（以上信息更新时间为：2019-11-25）
IEC 61163-1-2006 可靠性应力筛选.第1部分_批生产可修复产品.pdf
(1.49 MB)
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