标准号：ISO 22489-2006
实施状态：作废
中文名称：微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品
英文名称：Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
发布日期：2006-12
被替代标准：ISO 22489-2016
代替标准：ISO/DIS 22489-2005
采用标准：BS ISO 22489-2007,IDT;NF X21-006-2007,IDT
起草单位：ISO/TC 202
标准简介：This International Standard specifies requirements for the quantification of elements in a micrometre-sized
volume of a specimen identified through analysis of the X-rays generated by an electron beam using a
wavelength-dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning
electron microscope (SEM).
It describes:
— the principle of the quantitative analysis;
— the general coverage of this technique in terms of elements, mass fractions and reference specimens;
— the general requirements for the instrument;
— the fundamental procedures involved, such as specimen preparation, selection of experimental conditions,
the measurements, the analysis of these and the report.
This International Standard is intended for the quantitative analysis of a flat and homogeneous bulk specimen
using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data
reduction software. Operators should obtain information such as installation conditions, detailed procedures for
operation and specification of the instrument from the makers of any products used.
文件格式：PDF
文件大小：309.66KB
文件页数：22
（以上信息更新时间为：2019-11-22）
ISO 22489-2006 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品.pdf
(309.66 KB)
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