标准号：ISO 23833-2006
实施状态：作废
中文名称：微光束分析.电子探针微量分析(EPMA).词汇
英文名称：Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
发布日期：2006-12
被替代标准：ISO 23833-2013
代替标准：ISO/DIS 23833-2006
采用标准：BS ISO 23833-2007,IDT;GB/T 21636-2008,IDT;NF X21-009-2008,IDT;X21-009PR,IDT
起草单位：ISO/TC 202
标准简介：This International Standard defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.
This International Standard is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of this International Standard are applicable to those documents relevant to the practices of related fields (e.g. SEM, AEM, EDX) for definition of those terms common to them.
文件格式：PDF
文件大小：469.26KB
文件页数：60
（以上信息更新时间为：2019-11-22）
ISO 23833-2006 微光束分析.电子探针微量分析(EPMA).词汇.pdf
(469.26 KB)
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