标准号：ISO 15472-2001
实施状态：作废
中文名称：表面化学分析 X射线光电谱仪 能量刻度表校准
英文名称：Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
发布日期：2001-02
被替代标准：ISO 15472-2010
代替标准：ISO/FDIS 15472-2000
采用标准：BS ISO 15472-2001,IDT;GB/T 22571-2008,NEQ;NF X21-055-2006,IDT;X21-055PR,IDT;JIS K 0145-2002,IDT;JIS K 0145-2001,IDT
起草单位：ISO/TC 201
标准简介：This International Standard specifies a method for calibrating the binding-energy scales of X-ray photoelectron spectrometers, for general analytical purposes, using unmonochromated Al or Mg X-rays or monochromated Al X-rays. It is only applicable to instruments which incorporate an ion gun for sputter cleaning. This International Standard further specifies a method to establish a calibration schedule, to test for the binding-energy scale linearity at one intermediate energy, to confirm the uncertainty of the scale calibration at one low and one high binding-energy value, to correct for small drifts of that scale and to define the expanded uncertainty of the calibration of the binding-energy scale for a confidence level of 95 %. This uncertainty includes contributions for behaviours observed in interlaboratory studies but does not cover all of the defects that could occur. This International Standard is not applicable to instruments with binding-energy scale errors that are significantly non-linear with energy, to instruments operated in the constant retardation ratio mode at retardation ratios less than 10, to instruments with a spectrometer resolution worse than 1,5 eV, or to instruments requiring tolerance limits of ±0,03 eV or less. This International Standard does not provide a full calibration check, which would confirm the energy measured at each addressable point on the energy scale and which would have to be performed in accordance with the manufacturer's recommended procedures.
文件格式：PDF
文件大小：417.30KB
文件页数：34
（以上信息更新时间为：2019-11-23）
ISO 15472-2001 表面化学分析 X射线光电谱仪 能量刻度表校准.pdf
(417.3 KB)
|
|
